M E S E L
ELIN,
TTU
R & D
at the Chair of Applied Electronics
(until February 15, 2011 the Chair of Electronic Measurements)
Topics/Fields
Working Groups
More R&D related information
The Main Fields/Topics (in alphabetic order):
ADC.
Artificial Intelligence.
The BioMedical Electronics (BME).
Chip Design (ASIC).
Control in Electronic Systems.
DSP.
Effective Number of Bits of Analog Sensors.
EMC - ElectroMagnetic Compatibility.
Embedded µC/µP/DSP systems.
Information Technology.
Lock-in Measurement (LIM) technology.
Low power and low voltage analogue and mixed ASIC design.
Measurement instruments (incl. Metrology, etc.).
Measurement of Electrical Quantities (AC voltage, Complex Impedance/Admittance, etc.).
Measurement Systems (incl. Interfaces, BUSes, etc.).
Neuro-Fuzzy Applications.
Phase Locked Loops
(see also the PLL page of prof. Mart Min).
Robust and adaptive systems.
Security Systems.
Sensors.
Signals.
Smart House/Home.
Test and Diagnostics, Test and Measurement.
The Working Groups (in alphabetic order):
- B i o n i c s a n d M e d i c a l E l e c t r o n i c s ( B M E ) ,
- D i g i t a l S i g n a l P r o c e s s i n g ( D S P ) ,
- L o c k - i n / P h a s e - s e n s i t i v e m e a s u r e m e n t s ( L I M ) ,
- M e a s u r e m e n t s y s t e m s ,
- M e t r o l o g y o f a n a l o g s e n s o r s a n d A D C s ,
- P h a s e L o c k e d L o o p s ( P L L ) ,
- S i g n a l s , C i r c u i t s & S y s t e m s ,
- V o l t m e t r i c s .
The Working Groups with the related topics:
-
B i o n i c s a n d M e d i c a l E l e c t r o n i c s ( B M E ) (incl. the Bio-impedance).
Related topics:
Artificial Intelligence.
The BioMedical Electronics (BME).
Diagnostics (for the technical diagnostics please see Test and Diagnostics).
DSP.
Electrical Bio-Impedance Measurement.
EMC - ElectroMagnetic Compatibility.
The Lock-in Measurement (LIM) technology.
Low power and low voltage analogue and mixed ASIC design.
Measurement Systems (incl. Interfaces, etc.).
Neuro Fuzzy Applications.
Robust and adaptive systems.
Signals.
Smart House/Home.
-
D S P .
Related topics:
ADC.
Artificial Intelligence.
The BioMedical Electronics (BME).
DSP technology.
The Lock-in Measurement (LIM) technology.
Measurement Systems (incl. Interfaces, etc.).
Signals.
-
L o c k - i n / P h a s e - S e n s i t i v e M e a s u r e m e n t ( L I M ) t e c h n o l o g y.
Related topics:
ADC.
The BioMedical Electronics (BME).
Bio-Impedance.
DSP.
Effective Number of Bits of Analog Sensors.
EMC - ElectroMagnetic Compatibility.
The Lock-in Measurement (LIM) technology.
Low power and low voltage analogue and mixed ASIC design.
Measurement Systems (incl. Interfaces, etc.).
The Phase Locked Loops.
Phase Noise Measurement.
Sensors.
Signals.
Test and Diagnostics.
-
M e a s u r e m e n t S y s t e m s (incl. PC-based Systems, VXI, Interfaces, etc.).
Related topics:
ADC.
Artificial Intelligence.
The BioMedical Electronics (BME).
Intelligent measurement systems.
Programming in LabView.
The Lock-in Measurement (LIM) technology.
Measurement Systems (incl. Interfaces, etc.).
Sensors.
Smart House/Home.
Test and Diagnostics.
-
M e t r o l o g y o f A n a l o g S e n s o r s a n d A D C s.
Related topics:
ADC.
Effective Number of Bits of Analog Sensors.
EMC - ElectroMagnetic Compatibility.
The Lock-in Measurement (LIM) technology.
Measurement Systems (incl. Interfaces, etc.).
The Phase Locked Loops.
Signals.
Sensors.
-
P h a s e L o c k e d L o o p s ( P L L ).
Related topics:
The Lock-in Measurement (LIM) technology.
Low power and low voltage analogue and mixed ASIC design.
The Phase Locked Loops.
Robust and adaptive systems.
Signals.
Test and Diagnostics.
-
S i g n a l s , C i r c u i t s a n d S y s t e m s .
Related topics:
Artificial Intelligence.
The BioMedical Electronics (BME).
DSP.
Effective Number of Bits of Analog Sensors.
The Lock-in Measurement (LIM) technology.
Low power and low voltage analogue and mixed ASIC design.
Measurement Systems (incl. Interfaces, etc.).
Neuro Fuzzy Applications.
The Phase Locked Loops.
Robust and adaptive systems.
Signals.
Smart House/Home.
Test and Diagnostics.
-
V o l t m e t r i c s .
Related topics:
ADC.
Calibration.
DSP.
EMC - ElectroMagnetic Compatibility.
Errors of measurement/conversion.
The Lock-in Measurement (LIM) technology.
Measurement Systems (incl. Interfaces, etc.).
Metrology.
The Phase Locked Loops.
Precision AC-DC converters/detectors.
RMS conversion.
Signals.
Test and Diagnostics.
More of the R&D related information / links
General information about the R&D activity /
Üldist informatsiooni R&D-alase tegevuse kohta.
(the list of registered research projects, grants, etc.)
Information about the Conferences, Seminars, etc..
Information about the international contacts and co-operation.
Information about the publications.
URL:
http://www.elin.ttu.ee/mesel/R&D/R&D.htm.
08.08.1998 red. Last revised:
15.02.2011. T.Parve.